Company
About us
Core Value
History
Business
News
Products
haracteristic materials / consumables
Nano Silica Suspension
AFM tips
GRAPHENE
Tekna Spheroidized Powder/ Nano Powder
Process equipment
Atomic Deposition System Anric
Meiwafosis Pre-processing System for Point Microscope
Plasma-enhanced chemical vapor deposition system for TEOS multi-wafer processing
Inductively Coupled Plasma Etching System with Multiple Chambers
Plasma-Enhanced Chemical Vapor Deposition System (PECVD)
Plasma-Enhanced Chemical Vapor Deposition System PP1000 PECVD
Physical Vapor Deposition System PVD
Atomic Layer Deposition System FlexAL ALD
Electron Microscope High-Resolution Osmium Coating Machine
Measuring / Analyzing Instruments
OEG Optical Measurement
SURAGUS Non-Contact - Sheet Resistance and Film Thickness Measurement Instrument
SITA cleainess/ tension meter/ foam analysis
VINE Film Thickness Measurement
TEMIC SEM Tabletop Electron Microscope (Solid/Liquid)
XPS/ESCA X-ray Photoelectron Spectroscopy/X-ray Photoelectron Spectroscopy for Chemical Analysis
Precision X-ray Cabinet Irradiator for Cells/Animals
Unisoku
IMAGE
SPM Surface Morphology Analysis
STM Surface Morphology Analysis
SEM Surface Morphology Analysis
Nano-indenter Material Stress-Strain Analysis
Factory gas detector
CM4 Paper Tape Gas Detector
Vertex Paper Tape Gas Detector
Vertex-M Paper Tape Gas Detector
MIDAS Electrochemical Gas Detector
MIDAS-M Electrochemical Gas Detector
Satellite XT Electrochemical Gas Detector
ACM 150 FT-IR Gas Monitoring System
Sensepoint XCD Explosion-proof Gas Detector
RAEGuard 2 PID Volatile Organic Compound (VOC) Detector
SPM Flex Paper Tape Gas Detector
MIDAS Portable Gas Detector
BW Clip4 Multi-gas Portable Detector
BW Ultra Multi-gas Portable Detector
BW Solo Portable Detector
Riken Electrochemical Detector
Vertex Edge紙帶式氣體偵測器
Chemcassette Toxic Gas Detection
Electrochemical Gas Detector
FT-IR Centralized Gas Monitoring System
Explosion-proof Gas Detector
Portable Gas Detector
Manufacturing / production equipment
OIPT
CVI
TANKA Nanomaterials and Spherical Material Preparation Equipment
SURAGUS Non-Contact - Sheet Resistance and Film Thickness Measurement Instrument
Wafer Cleaving Machine SELA
semiconductor
Particle Deposition System
Particle Deposition Services
SELA
X-ray Photoelectron Spectroscopy/X-ray Photoelectron Spectroscopy for Chemical Analysis
HoneyWell
Academic field
Cryogenic System Bluefors
Cryogenic System CIA
Scanning Tunneling Microscope RHK
Scanning Tunneling Microscope Unisoku
High-Temperature Equipment CVI
X-ray Photoelectron Spectroscopy/X-ray Photoelectron Spectroscopy for Chemical Analysis
Qdevil Quantum/Low-Temperature Electronic Components
Quantum research
Toxic Gas Monitoring System Integration
Brands
HONEYWELL
Thermo Fisher Scientific
MSP
SURAGUS
TEMIC
SELA
SITA
GRAFENIA
OEG
Careers
Employee Benefits
Recruitment message
CONTACT
English
繁中
简中
日本語
한국어
ไทย
Tiếng Việt
Quotation Form
INQUIRY
/ INQUIRY /
Product Image
Product Name
Delete
Scanning Probe Image Processing Software
Messages Form
Name
*
Email
*
Subject
Telephone
*
Content
Verify Code
*
SEND
